Threshold voltage model for deep-submicron fully-depleted SOI CMOS transistors including the effect of source/drain fringing fields into the buried oxide

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Authors
van Meer, Hans; De Meyer, Kristin
Conference
European Meeting on Silicon on Insulator Devices; 25-27 October 2000; Granada, Spain.
Title
Threshold voltage model for deep-submicron fully-depleted SOI CMOS transistors including the effect of source/drain fringing fields into the buried oxide
Publication type
Oral presentation
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