Publication:
Electrical stress characteristics of MOS capacitors with p-type poly-SiGe and poly-Si gates in the direct tunneling regime
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1877 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-09
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Views
1877 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-09
Citations