Publication:
Electrical stress characteristics of MOS capacitors with p-type poly-SiGe and poly-Si gates in the direct tunneling regime
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1879 since deposited on 2021-10-14
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Acq. date: 2026-09-11
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Statistics
Views
1879 since deposited on 2021-10-14
1last month
1last week
Acq. date: 2026-09-11
Citations