Browsing Articles by imec author "42a548c9f15c160767d6f83006cf635cea6ff376"
Now showing items 21-40 of 67
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Electrical characterization of single nanometer-wide Si fins in dense arrays
Folkersma, Steven; Bogdanowicz, Janusz; Schulze, Andreas; Favia, Paola; Dirch, Petersen; Ole, Hansen; Henrik, Henrichsen; Nielsen, Peter; Shiv, Lior; Vandervorst, Wilfried (2018) -
Electrically active defects at the AlN/Si(111) interface studied by DLTS and ESR
Simoen, Eddy; Visalli, Domenica; Van Hove, Marleen; Leys, Maarten; Favia, Paola; Bender, Hugo; Borghs, Gustaaf; Nguyen, A.P.D.; Stesmans, Andre (2012) -
Epitaxial CVD growth of ultra-thin Si passivation layers on strained Ge fin structures
Loo, Roger; Arimura, Hiroaki; Cott, Daire; Witters, Liesbeth; Pourtois, Geoffrey; Schulze, Andreas; Douhard, Bastien; Vanherle, Wendy; Eneman, Geert; Richard, Olivier; Favia, Paola; Mitard, Jerome; Mocuta, Dan; Langer, Robert; Collaert, Nadine (2018-02) -
Ferroelectric La-Doped ZrO2/HfxZr1-xO2 Bilayer Stacks with Enhanced Endurance
Popovici, Mihaela Ioana; Walke, Amey; Banerjee, Kaustuv; Ronchi, Nicolo; Meersschaut, Johan; Celano, Umberto; McMitchell, Sean; Spampinato, Valentina; Franquet, Alexis; Favia, Paola; Swerts, Johan; Van den Bosch, Geert; Van Houdt, Jan (2021) -
Ferroelectricity in Si-doped hafnia: probing challenges in absence of screening charges
Celano, Umberto; Gomez, Andres; Piedimonte, Paola; Neumayer, Sabine; Collins, Liam; Popovici, Mihaela Ioana; Florent, Karine; McMitchell, Sean; Favia, Paola; Drijbooms, Chris; Bender, Hugo; Paredis, Kristof; Di Piazza, Luca; Jesse, Stephen; Van Houdt, Jan; van der Heide, Paul (2020) -
First demonstration of vertically stacked gate-all-around highly strained germanium nanowire pFETs
Capogreco, Elena; Witters, Liesbeth; Arimura, Hiroaki; Sebaai, Farid; Porret, Clément; Hikavyy, Andriy; Loo, Roger; Milenin, Alexey; Eneman, Geert; Favia, Paola; Bender, Hugo; Wostyn, Kurt; Dentoni Litta, Eugenio; Schulze, Andreas; Vrancken, Christa; Opdebeeck, Ann; Mitard, Jerome; Langer, Robert; Holsteyns, Frank; Waldron, Niamh; Barla, Kathy; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2018-11) -
Formation of V-grooves on the (Al,Ga)N surface as means of tensile stress relaxation
Cheng, Kai; Leys, Maarten; Degroote, Stefan; Bender, Hugo; Favia, Paola; Borghs, Gustaaf; Germain, Marianne (2012) -
Ge instability and the growth of Ge epitaxial layers in nanochannels on patterned Si (001) substrates
Wang, Gang; Rosseel, Erik; Loo, Roger; Favia, Paola; Bender, Hugo; Caymax, Matty; Heyns, Marc; Vandervorst, Wilfried (2010-12) -
Grain-boundary-induced strain and distortion in epitaxial bilayer MoS2 lattice
Nalin Mehta, Ankit; Mo, Jiongjiong; Pourtois, Geoffrey; Dabral, Ashish; Groven, Benjamin; Bender, Hugo; Favia, Paola; Caymax, Matty; Vandervorst, Wilfried (2020) -
Growth techniques to reduce V-defect density in GaN and AlGaN layers grown on 200 mm Si (111) substrate
Liang, Hu; Saripalli, Yoga; Kandaswamy, Prem Kumar; Carlson, Eric Porter; Favia, Paola; Richard, Olivier; Bender, Hugo; Zhao, Ming; Thapa, Sarad Bahadur; Vancoille, Eric (2014) -
High absorption contrast quantum confined stark effect in ultra-thin Ge/SiGe quantum well stacks grown on si
Srinivasan, Ashwyn; Porret, Clément; Vissers, Ewoud; Favia, Paola; De Coster, Jeroen; Bender, Hugo; Loo, Roger; Van Thourhout, Dries; Van Campenhout, Joris; Pantouvaki, Marianna (2020-02) -
High quality Ge epitaxial layers in narrow channels on Si (001) substrates
Wang, Gang; Rosseel, Erik; Loo, Roger; Favia, Paola; Bender, Hugo; Heyns, Marc; Vandervorst, Wilfried (2010) -
High-k dielectrics for future generation memory devices
Kittl, Jorge; Opsomer, Karl; Popovici, Mihaela Ioana; Menou, Nicolas; Kaczer, Ben; Wang, Xin Peng; Adelmann, Christoph; Pawlak, Malgorzata; Tomida, Kazuyuki; Rothschild, Aude; Govoreanu, Bogdan; Degraeve, Robin; Schaekers, Marc; Zahid, Mohammed; Delabie, Annelies; Meersschaut, Johan; Polspoel, Wouter; Clima, Sergiu; Pourtois, Geoffrey; Knaepen, W.; Detavernier, C.; Afanasiev, Valeri; Blomberg, T.; Pierreux, Dieter; Swerts, Johan; Fischer, Pamela; Maes, Jan; Manger, Dirk; Vandervorst, Wilfried; Conard, Thierry; Franquet, Alexis; Favia, Paola; Bender, Hugo; Brijs, Bert; Van Elshocht, Sven; Jurczak, Gosia; Van Houdt, Jan; Wouters, Dirk (2009) -
Impact of crystallization behavior of SrxTiyOz films on electrical properties of metal-insulator-metal capacitors with TiN electrodes
Pawlak, Malgorzata; Kaczer, Ben; Kim, Min-Soo; Popovici, Mihaela Ioana; Tomida, Kazuyuki; Swerts, Johan; Opsomer, Karl; Polspoel, Wouter; Favia, Paola; Vrancken, Christa; Demeurisse, Caroline; Wang, W.-C.; Afanasiev, Valeri; Vandervorst, Wilfried; Bender, Hugo; Debusschere, Ingrid; Altimime, Laith; Kittl, Jorge (2010) -
Impact of thermal treatment upon morphology and crystallinity of strontium titanate films deposited by atomic layer deposition
Popovici, Mihaela Ioana; Van Elshocht, Sven; Menou, Nicolas; Favia, Paola; Bender, Hugo; Rosseel, Erik; Swerts, Johan; Adelmann, Christoph; Vrancken, Christa; Moussa, Alain; Tielens, Hilde; Tomida, Kazuyuki; Pawlak, Malgorzata; Kaczer, Ben; Schoofs, Geert; Vandervorst, Wilfried; Wouters, Dirk; Kittl, Jorge (2011) -
Interfacial control of SrTiO3/Si(001) epitaxy and its effect on physical and optical properties
Wang, Tsang-Hsuan; Gehlhaar, Robert; Conard, Thierry; Favia, Paola; Genoe, Jan; Merckling, Clement (2022) -
Investigation of aged organic solar cells stacks by cross-sectional transmission electron microscopy coupled with elemental analysis
Favia, Paola; Voroshazi, Eszter; Heremans, Paul; Bender, Hugo (2013) -
MOCVD growth of DH-HEMT buffers with low-temperature AlN interlayer on 200 mm Si (111) substrate for breakdown voltage enhancement
Zhao, Ming; Liang, Hu; Kandaswamy, Prem Kumar; Van Hove, Marleen; Venegas, Rafael; Vrancken, Evi; Favia, Paola; Vanderheyden, Annelies; Vanhaeren, Danielle; Saripalli, Yoga; Decoutere, Stefaan; Langer, Robert (2016) -
Monte Carlo Analysis of p-Type Si0.75Ge0.25-Channel Nanosheet Performance
Bufler, Fabian; Arimura, Hiroaki; Favia, Paola; Eneman, Geert; Matagne, Philippe; Horiguchi, Naoto; Hellings, Geert (2022) -
Nanobeam dffraction: technique evaluation and strain measurement on complementary metal oxide semiconductor devices
Favia, Paola; Bargallo Gonzalez, Mireia; Simoen, Eddy; Verheyen, Peter; Klenov, Dmitri; Bender, Hugo (2011)