Browsing Articles by author "Vaisman Chasin, Adrian"
Now showing items 21-34 of 34
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High-performance a-In-Ga-Zn-O Schottky diode with oxygen-treated metal
Vaisman Chasin, Adrian; Steudel, Soeren; Myny, Kris; Nag, Manoj; Ke, Tung Huei; Schols, Sarah; Genoe, Jan; Gielen, Georges; Heremans, Paul (2012) -
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs
Tyaginov, Stanislav; O'Sullivan, Barry; Vaisman Chasin, Adrian; Rawal, Yaksh; Chiarella, Thomas; Toledo de Carvalho Cavalcante, Camila; Kimura, Yosuke; Vandemaele, Michiel; Ritzenthaler, Romain; Mitard, Jerome; Vadakupudhu Palayam, Senthil; Reifsnider, Jason; Kaczer, Ben (2023) -
Impact of the device geometric parameters on hot-carrier degradation in FinFETs
Tyaginov, Stanislav; Makarov, Alexander; Kaczer, Ben; Jech, Markus; Vaisman Chasin, Adrian; Grill, Alexander; Hellings, Geert; Vexler, Mikhail; Linten, Dimitri; Grasser, Tibor (2018) -
Integrated tin monoxide P-channel thin-film transistors for digital circuit applications
Rockele, Maarten; Vasseur, Karolien; Mityashin, Alexander; Muller, Robert; Vaisman Chasin, Adrian; Nag, Manoj; Bhoolokam, Ajay; Genoe, Jan; Heremans, Paul; Myny, Kris (2018-02) -
Medium frequency physical vapor deposited Al2O3 and SiO2 as etch-stop-layers for amorphous Indium-Gallium-Zinc-Oxide thin-film-transistors
Nag, Manoj; Bhoolokam, Ajay; Steudel, Soeren; Vaisman Chasin, Adrian; Maas, Joris; Genoe, Jan; Murata, Mitsuhiro; Groeseneken, Guido; Heremans, Paul (2015) -
Modeling and Understanding the Compact Performance of h-BN Dual-Gated ReS2 Transistor
Lee, Kookjin; Choi, Junhee; Kaczer, Ben; Grill, Alexander; Lee, Jae Woo; Van Beek, Simon; Bury, Erik; Diaz Fortuny, Javier; Vaisman Chasin, Adrian; Lee, Jaewoo; Chun, Jungu; Shin, Dong Hoon; Na, Junhong; Cho, Hyeran; Lee, Sang Wook; Kim, Gyu-Tae (2021) -
Novel back-channel-etch process flow based a-IGZO TFTs for circuit and display applications on PEN- foil
Nag, Manoj; Rockele, Maarten; Steudel, Soeren; Vaisman Chasin, Adrian; Myny, Kris; Bhoolokam, Ajay; Willegems, Myriam; Smout, Steve; Vicca, Peter; Ameys, Marc; Ke, Tung Huei; Schols, Sarah; Genoe, Jan; Groeseneken, Guido; Heremans, Paul (2013) -
Scaling down of organic complementary logic gates for compact logic on foil
Ke, Tung Huei; Muller, Robert; Kam, Benjamin; Rockele, Maarten; Vaisman Chasin, Adrian; Myny, Kris; Steudel, Soeren; Oosterbaan, Wibren; Lutsen, Laurence; Genoe, Jan; van Leuken, Linda; van der Putten, Bas; Heremans, Paul (2014) -
Single-source dual-layer amorphous IGZO thin-film transistors for display and circuit applications
Nag, Manoj; Vaisman Chasin, Adrian; Rockele, Maarten; Steudel, Soeren; Myny, Kris; Bhoolokam, Ajay; Tripathi, Ashutosh; van der Putten, Bas; Kumar, Abishek; van der Steen, Jan Laurens; Genoe, Jan; Li, Flora; Maas, Joris; van Veenendaal, Erik; Gelinck, Gerwin; Heremans, Paul (2013) -
Stochastic modeling of the impact of random dopants on hot-carrier degradation in n-FinFETs
Makarov, Alexander; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Grill, Alexander; Vandemaele, Michiel; Hellings, Geert; El-Sayed, Al-Moatasem; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019) -
The Impact of IGZO Channel Composition on DRAM Transistor Performance
Kruv, Anastasiia; van Setten, Michiel; Dekkers, Harold; Lorant, Christophe; Verreck, Devin; Smets, Quentin; Yengula Venkata Ramana, Bhuvaneshwari; Belmonte, Attilio; Subhechha, Subhali; Vaisman Chasin, Adrian; Delhougne, Romain; Kar, Gouri Sankar (2023) -
The impact of self-heating and its implications on hot-carrier degradation-A modeling study
Makarov, A.; Jech, M.; Tyaginov, Stanislav; Vaisman Chasin, Adrian; Bury, Erik; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Linten, Dimitri; Kaczer, Ben (2021) -
Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors
Guo, Zixiang; Li, Kan; Li, Xun; Luo, Xuyi; Zhang, En Xia; Reed, Robert A.; Schrimpf, Ronald D.; Fleetwood, Daniel M.; Vaisman Chasin, Adrian; Mitard, Jerome; Linten, Dimitri (2023) -
Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study
Vandemaele, Michiel; Kaczer, Ben; Tyaginov, Stanislav; Franco, Jacopo; Bury, Erik; Vaisman Chasin, Adrian; Makarov, Alexander; Hellings, Geert; Groeseneken, Guido (2023)