Authors

Anghel, C.; Hefyene, N.; Ionescu, A. M.; Vermandel, Miguel; Bakeroot, Benoit; Doutrloigne, J.; Gillon, R.; Frere, S.; Maier., C.; Mourier, Y.

Conference

Proceedings of the 31st European Solid-State Device Research Conference

Title

Investigations and physical modelling of saturation effects in lateral DMOS transistor architectures based on the concept of intrinsic drain voltage

Publication type

Proceedings paper