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Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM
Publication:
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM
Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Gryse, O.
;
Clauws, P.
;
Lebedev, O.
;
Van Landuyt, J.
;
Vanhellemont, Jan
;
Claeys, C.
;
Simoen, Eddy
Journal
Physica B
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1954
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1954
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations