Publication:
Reliable gate-voltage-dependent channel-length and series resistance extraction technique taking into account threshold voltage reduction in MOSFETs
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1901 since deposited on 2021-09-29
1last month
Acq. date: 2026-06-07
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Views
1901 since deposited on 2021-09-29
1last month
Acq. date: 2026-06-07
Citations