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Reliable gate-voltage-dependent channel-length and series resistance extraction technique taking into account threshold voltage reduction in MOSFETs
Publication:
Reliable gate-voltage-dependent channel-length and series resistance extraction technique taking into account threshold voltage reduction in MOSFETs
Date
1995
Proceedings Paper
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498.pdf
254.36 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Biesemans, Serge
;
Kubicek, Stefan
;
De Meyer, Kristin
Journal
Abstract
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1892
since deposited on 2021-09-29
Acq. date: 2025-10-29
Citations
Metrics
Views
1892
since deposited on 2021-09-29
Acq. date: 2025-10-29
Citations