Publication:

A new technique to extract the oxide charge density at front and back interfaces of SOI NMOSFETs devices

Date

2001

Proceedings Paper

Simple item page Full metadata Statistics

Author(s)

Nicolett, A. S.

;

Martino, Joao Antonio

;

;

Statistics

1926 since deposited on 2021-10-14

3last month

Acq. date: 2026-02-25