Browsing Presentations by author "Cardon, F."
Now showing items 1-5 of 5
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A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers
Van Meirhaeghe, R.; Vanalme, G.; Goubert, L.; Cardon, F.; Van Daele, P. (1998) -
Controlling CoSi2 nucleation: the effect of entropy of mixing
Detavernier, C.; Van Meirhaeghe, R. L.; Maex, Karen; Cardon, F. (2000) -
Orientation dependent stress build-up during the formation of epitaxial CoSi2
Steegen, An; Detavernier, C.; Maex, Karen; Van Meirhaeghe, R. L.; Cardon, F. (2000) -
Silicide engineering: influence of alloying elements on CoSi2 nucleation
Detavernier, C.; Van Meirhaeghe, R. L.; Maex, Karen; Cardon, F. (2000) -
The influence of Ti capping layers on CoSi2 formation
Detavernier, C.; Donaton, R.; Maex, Karen; Van Meirhaeghe, R.; Cardon, F. (1999)