Browsing Presentations by author "Takakura, K."
Now showing items 1-20 of 20
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A model for the radiation degradation of polycrystalline silicon films
Ohyama, H.; Nakabayashi, M.; Takakura, K.; Simoen, Eddy; Takami, Y.; Claeys, Cor (2002) -
Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
Matsuyama, K.; Hayama, K.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Effect of electron irradiation on thermal donors in oxygen-doped high-resistivity FZ Si
Takakura, K.; Ohyama, H.; Yoshida, T.; Murakawa, H.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2003) -
Effect of high-temperature electron irradiation in deep submicron MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003) -
Effects of electron irradiation on IGBT devices
Ohyama, H.; Takakura, K.; Nakabayashi, M.; Hirao, T.; Onoda, S.; Kamiya, T.; Simoen, Eddy; Claeys, Cor (2003) -
Effects of high-temperature electron irradiation on submicron MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2002) -
Effects of irradiation temperature on radiation damage in electron-irradiated MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2002) -
Electrical properties of strained Si MOSFETs by high-fluence electron-irradiation
Takakura, K.; Aoki, Y.; Hayama, K.; Oyana, H.; Simoen, Eddy; Claeys, Cor (2007) -
Electron irradiation effects on thermal donors in Cz-Si
Takakura, K.; Ohyama, Hidenori; Murakawa, H.; Yoshida, T.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2003) -
Electron irradiation of IGBTs
Nakabayashi, M.; Iwata, T.; Ohyama, H.; Takakura, K.; Yoneoka, M.; Simoen, Eddy; Claeys, Cor (2004) -
High temperature electron irradiation effects in InGaAs photodiodes
Ohyama, H.; Takakura, K.; Hayama, K.; Hirao, T.; Onoda, S.; Simoen, Eddy; Claeys, Cor (2003) -
Irradiation temperature dependence of radiation damage in STI diodes
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2002) -
Radiation damage in deep submicron MOSFETs by high-temperature electron irradiation
Hayama, K.; Ohyama, H.; Takakura, K.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2002) -
Radiation damage in proton-irradiated stained Si n-MOSFETs
Ohtani, T.; Hayama, K.; Takakura, K.; Kudou, T.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007) -
Radiation damage in Si photodiodes by high temperature irradiation
Ohyama, Hidenori; Takakura, K.; Simoen, Eddy; Claeys, Cor; Uemura, J.; Kishikawa, T.; Kobayashi, K. (2002) -
Radiation damage of Ge diodes and MOSFETs on Ge-on-Si substrates
Nakamura, H.; Nagano, T.; Sukizaki, H.; Sakamoto, K.; Takakura, K.; Ohyama, H.; Kuboyama, S.; Simoen, Eddy; Claeys, Cor (2008) -
Radiation damage of InGaAs photodiodes by high-temperature electron and neutron irradiation
Ohyama, H.; Takakura, K.; Hayama, K.; Simoen, Eddy; Claeys, Cor; Toshio, H. (2003) -
Radiation damages in STI diodes after high temperature electron-irradiation
Ohyama, H.; Hayama, K.; Takakura, K.; Miura, T.; Simoen, Eddy; Poyai, Amporn; Takami, Y.; Claeys, Cor (2002) -
Radiation damages of SiC Schottky diodes by electron irradiation
Ohyama, H.; Takakura, K.; Watanabe, T.; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor (2004) -
Radiation tolerance in HfSiON gate MOSFETs by high-energy Particles irradation
Hayama, K.; Takakura, K.; Nishimura, A.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005)