Browsing Presentations by imec author "4fe93ec5f1ee5c84df79a850485b973ec41d19e5"
Now showing items 21-35 of 35
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On the apparent decay length of metal at the metal-oxide/Si interface
Conard, Thierry; Vandervorst, Wilfried; Franquet, Alexis; Berghmans, Bart; Van Elshocht, Sven (2007) -
Organic solar cell composition profiling by large clusters ions
Franquet, Alexis; Conard, Thierry; Voroshazi, Eszter; Cheyns, David; Vandervorst, Wilfried (2012) -
Probing ultra thin Si passivation layers on Ge-substrates
Vandervorst, Wilfried; Douhard, Bastien; Delmotte, Joris; Franquet, Alexis; Vincent, Benjamin; Caymax, Matty (2011) -
Real 3D depth profiling of heterogeneous microelectronic structures using a combined ToF-SIMS/in-situ SPM tool
Franquet, Alexis; Spampinato, Valentina; Vandervorst, Wilfried; van der Heide, Paul (2018) -
"Self-Focusing – SIMS" : composition analysis of thin films beyond the lateral resolution
Franquet, Alexis; Douhard, Bastien; Conard, Thierry; Vandervorst, Wilfried (2016) -
Stretching the limits of the aqueous solution-gel synthesis for electroceramic metal oxides
Hardy, An; Van Elshocht, Sven; Van Bael, Marlies; Van den Rul, Heidi; D'Haen, Jan; Douheret, Olivier; Richard, Olivier; Franquet, Alexis; Conard, Thierry; Adelmann, Christoph; De Gendt, Stefan; Caymax, Matty; D'Olieslaeger, Marc; Heyns, Marc; Mullens, J. (2007) -
Study of the initial substrate surface and nucleation process of InAs NW epitaxy on Si (111)
Liu, Ziyang; Merckling, Clement; Rooyackers, Rita; Franquet, Alexis; Richard, Olivier; Bender, Hugo; Vila Santos, Maria; Rubio-Zuazo, Juan; Castro, Germán; Collaert, Nadine; Thean, Aaron; Vandervorst, Wilfried; Heyns, Marc (2016) -
Surface and bulk chemistry of HOPG electrochemical exfoliation: new insights from low-energy ion beam analysis
Tortora, Luca; De Rosa, Stefania; Branchini, Paolo; Spampinato, Valentina; Franquet, Alexis; Duo', Lamberto; Bussetti, Gianlorenzo (2019) -
Surface redeposition and damage due to focused ion beam milling
Bender, Hugo; Franquet, Alexis; Drijbooms, Chris; Parmentier, Brigitte; Vandervorst, Wilfried; Kwakman, Laurens (2015) -
Thin photoresist layers for microelectronic devices: a comparative study between ToF and Orbitrap™ mass analyzers.
Spampinato, Valentina; Franquet, Alexis; De Simone, Danilo; Pollentier, Ivan; Vandenbroeck, Nadia; Pirkl, Alexander; Kayser, Sven; Vandervorst, Wilfried; van der Heide, Paul (2019) -
(TOF)SIMS applications to micro/nano electronics
Franquet, Alexis; Spampinato, Valentina (2021) -
TOF- and G-SIMS characterization of organic solar cell materials
Franquet, Alexis; Koctepe, Melih; Conard, Thierry; Cheyns, David; Voroshazi, Eszter; Vandervorst, Wilfried (2010) -
ToF-SIMS and XPS study of ion implanted 248nm deep ultraviolet (DUV) photoresist
Franquet, Alexis; Tsvetanova, Diana; Conard, Thierry; Vos, Rita; Vereecke, Guy; Mertens, Paul; Heyns, Marc; Vandervorst, Wilfried (2010) -
Ultrathin film high-k dielectrics from aqueous CSD: relations between deposition route, material properties and electrical properties
Hardy, An; Van Elshocht, Sven; Van Bael, Marlies; D'Haen, Jan; De Gendt, Stefan; Adelmann, Christoph; Conard, Thierry; Franquet, Alexis; Richard, Olivier; D'Olieslaeger, Marc; Heyns, Marc; Mullens, J. (2008) -
Ultrathin high-k dielectrics from aqueous chemical solution deposition
Hardy, An; Van Elshocht, Sven; Van Bael, Marlies; D'Haen, Jan; Douheret, Olivier; De Gendt, Stefan; Adelmann, Christoph; Caymax, Matty; Conard, Thierry; Richard, Olivier; Franquet, Alexis; D'Olieslaeger, Marc; Heyns, Marc; Mullens, J. (2007)