Browsing Presentations by author "Maes, Herman"
Now showing items 21-40 of 45
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Influence of Boron diffusion on reliability of ultra-thin oxides
Nigam, Tanya; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido; Maes, Herman (1998) -
Informatie- en Communicatietechnologie als Ondersteuning van Leeractiviteiten
Maes, Herman; Van Overstraeten, Roger (1995) -
Integration of Pt/PZT/Pt ferroelectric capacitors into 0.5μm CMOS process for embedded FERAM
Wouters, Dirk; Norga, Gerd; Haspeslagh, Luc; Deferm, Ludo; Maes, Herman (1999) -
Low Temperature Anneal of Electron Irradiation Induced Defects in p-Type Silicon
Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Clauws, P. (1994) -
Low Temperature Anneal of the Divacancy in p-Type Silicon
Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Clauws, P. (1994) -
Measurement of nonuniform stresses in semiconductor films by optical methods
Pinardi, Kuntjoro; Jain, Suresh; Maes, Herman; Van Overstraeten, Roger; Willander, M.; Atkinson, A. (1997) -
Mechanical and optical properties of selectively grown AlGaN stripes
Jain, Suresh; Pinardi, Kuntjoro; Maes, Herman; Willander, M. (1997) -
New insights in the impact of the breakdown mechanisms on the statistics of intrinsic and extrinsic breakdown in thin oxides
Groeseneken, Guido; Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Depas, Michel; Maes, Herman (1996) -
Non-volatile information storage in semiconductor memories: present and future
Maes, Herman; Van Houdt, Jan; Wouters, D.; De Boeck, Jo (2000) -
Novel small-area read-out circuit for multi-level memories
Montanari, Donato; Van Houdt, Jan; Wellekens, Dirk; Groeseneken, Guido; Maes, Herman (1997) -
Orientation Effects on the Hysteresis Properties of Sol-Gel and Laser-Ablated Lead-Zirconate-Titanate (PbZrxTi1-xO3=PZT) Thin Films
Wouters, D. J.; Willems, Geert; Maes, Herman (1995) -
Platinum template layer for texture control in PZT fecaps with reactively sputtered RuO2 electrode layers
Norga, Gerd; Wouters, Dirk; Maes, Herman (1997) -
Process-Induced Stress in LOPOS Isolated Si Structures Measured with Micro-Raman Spectroscopy
Watté, J.; Provoost, R.; Silverans, R. E.; De Wolf, Ingrid; Maes, Herman (1995) -
Reliability of ultra-thin dielectrics for giga scale silicon technologies
Maes, Herman; Degraeve, Robin; Nigam, Tanya; De Blauwe, Jan; Groeseneken, Guido (1998) -
Reliable 5.9nm tunnel oxide flash EEPROM device
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Haspeslagh, Luc; Groeseneken, Guido; Maes, Herman (1997) -
Scaling of sol-gel PZT ferroelectric capacitors for low-voltage operation
Wouters, Dirk; Norga, Gerd; Beckers, Françoise; Bogaerts, Lieve; Maes, Herman (1997) -
Sol-gel growth of high quality Pb (Zr.30, Ti.70) films onf RuO 2 using seedlayers
Norga, Gerd; Wouters, Dirk; Fè, Laura; Bartic, T. A.; Maes, Herman (1998) -
Sol-gel growth of PZT on reactively sputtered RuO2 electrodes
Norga, Gerd; Fè, Laura; Wouters, Dirk; Iing, S.; Maes, Herman (1999) -
Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R. (1995) -
Stresses in LOCOS, stripes and quantum device heterostructures
Jain, Suresh; Maes, Herman; Willander, M. (1996)