Recently added

Miniaturized electronic nose

Karabacak, Devrez (2012)

Atom-probe for arsenic implant doped FinFET characterization

Kambham, Ajay Kumar; Kumar, Arul; Gilbert, Matthieu; Vandervorst, Wilfried (2012)

3D site specific sample preparation and analysis of 3D devices (Finfets) by atom probe tomography

Kambham, Ajay Kumar; Kumar, Arul; Gilbert, Matthieu; Vandervorst, Wilfried (2012)

Origin of the memory window in organic ferroelectric field-effect transistors

Kam, Benjamin; Li, Xiaoran; Cristoferi, Claudio; Smits, Edsger C.P.; Mityashin, Alexander; Ke, Tung Huei; Schols, Sarah; Genoe, Jan; Gelinck, Gerwin; Heremans, Paul (2012)

Reliability aware design: from single defect physics to circuit simulations

Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Weckx, Pieter; Grasser, Tibor; Roussel, Philippe; Groeseneken, Guido (2012)

Recent trends in CMOS reliability: from individual traps to circuit simulations

Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Grasser, Tibor; Roussel, Philippe; Camargo, V. V. A.; Mahato, S.; Simoen, Eddy; Catthoor, Francky; Wirth, G. I.; Groeseneken, Guido (2012)

Advanced experimental techniques for BTI characterization (tutorial)

Kaczer, Ben (2012)

Advanced CMOS devices and reliability (tutorial)

Kaczer, Ben (2012)

Advanced experimental techniques for BTI characterization (tutorial)

Kaczer, Ben (2012)

Minimizing particle contamination of NXE3100 reticles

Jonckheere, Rik; Baudemprez, Bart; Waehler, Tobias; Van Den Heuvel, Dieter; Schmalfuss, Heiko; Brux, Oliver; Dress, Peter; Kappel, Christophe; Zickler, Leander (2012)

Phase separation of ethanol-water solutions at diverse terminated diamond surfaces

Janssens, S.D.; Yeap, W.S.; Drijkoningen, S.; Yin, H.; Boyen, Hans-Gerd; Larsson, K.; Haenen, Ken (2012)

Characterization of B-doped ultra-nanocrystalline diamond films grown by plasma enhanced CVD under a continuous DC bias

Janssen, W.; Ruttens, B.; Degutis, G.; Lu, Y.G.; Turner, S.; Verbeeck, J.; Van Tendeloo, G.; Van Bael, Marlies; Hardy, An; Haenen, Ken (2012)

Energy harvesters for intelligent tires using AlN and PZT films

Jambunathan, Madhu (2012)

Digital intensive transmitters in nanoscale CMOS

Ingels, Mark (2012)

10x power reduction with 10x more variability: does it make sense?

Huisken, Jos (2012)

Future cell concepts in mass production and their maximum efficiencies

Horzel, Jörg; Poortmans, Jef (2012)

On future industrial Si solar cells and the importance of diffusion processes

Horzel, Jörg (2012)

Outlook on TunnelFET devices

Heyns, Marc; Verhulst, Anne (2012)

Advancing CMOS beyond the Si roadmap: chronicle of a (r)evolution foretold

Heyns, Marc (2012)

How to maintain the performance at reduced power in future CMOS

Heyns, Marc (2012)

Presentations: Recent submissions

Miniaturized electronic nose ﻿

Atom-probe for arsenic implant doped FinFET characterization ﻿

3D site specific sample preparation and analysis of 3D devices (Finfets) by atom probe tomography ﻿

Origin of the memory window in organic ferroelectric field-effect transistors ﻿

Reliability aware design: from single defect physics to circuit simulations ﻿

Recent trends in CMOS reliability: from individual traps to circuit simulations ﻿

Advanced experimental techniques for BTI characterization (tutorial) ﻿

Advanced CMOS devices and reliability (tutorial) ﻿

Advanced experimental techniques for BTI characterization (tutorial) ﻿

Minimizing particle contamination of NXE3100 reticles ﻿

Phase separation of ethanol-water solutions at diverse terminated diamond surfaces ﻿

Characterization of B-doped ultra-nanocrystalline diamond films grown by plasma enhanced CVD under a continuous DC bias ﻿

Energy harvesters for intelligent tires using AlN and PZT films ﻿

Digital intensive transmitters in nanoscale CMOS ﻿

10x power reduction with 10x more variability: does it make sense? ﻿

Future cell concepts in mass production and their maximum efficiencies ﻿

On future industrial Si solar cells and the importance of diffusion processes ﻿

Outlook on TunnelFET devices ﻿

Advancing CMOS beyond the Si roadmap: chronicle of a (r)evolution foretold ﻿

How to maintain the performance at reduced power in future CMOS ﻿

Miniaturized electronic nose

Atom-probe for arsenic implant doped FinFET characterization

3D site specific sample preparation and analysis of 3D devices (Finfets) by atom probe tomography

Origin of the memory window in organic ferroelectric field-effect transistors

Reliability aware design: from single defect physics to circuit simulations

Recent trends in CMOS reliability: from individual traps to circuit simulations

Advanced experimental techniques for BTI characterization (tutorial)

Advanced CMOS devices and reliability (tutorial)

Advanced experimental techniques for BTI characterization (tutorial)

Minimizing particle contamination of NXE3100 reticles

Phase separation of ethanol-water solutions at diverse terminated diamond surfaces

Characterization of B-doped ultra-nanocrystalline diamond films grown by plasma enhanced CVD under a continuous DC bias

Energy harvesters for intelligent tires using AlN and PZT films

Digital intensive transmitters in nanoscale CMOS

10x power reduction with 10x more variability: does it make sense?

Future cell concepts in mass production and their maximum efficiencies

On future industrial Si solar cells and the importance of diffusion processes

Outlook on TunnelFET devices

Advancing CMOS beyond the Si roadmap: chronicle of a (r)evolution foretold

How to maintain the performance at reduced power in future CMOS