Recently added

Piezoresistivity in ultra-thin nanocrystalline diamond membranes

Drijkoningen, Sien; Janssens, Stoffel; Pobedinskas, Paulius; Van Bael, Marlies; Haenen, Ken (2016)

On the use of Cu alloys as a cation supply layer in CBRAM

Devulder, Wouter; Opsomer, Karl; Goux, Ludovic; Detavernier, Christophe (2016)

1-μm-thin crystalline silicon solar cells with pseudo-ordered nanotextures

Depauw, Valerie; Massiot, Ines; Chen, Wanghua; Trompoukis, Christos; Bearda, Twan; Dmitriev, Alexandre; Roca i Cabarrocas, Pere; Gordon, Ivan; Poortmans, Jef (2016)

Large gas clusters for damageless molecular depth-profiling:

Delcorte, Arnaud; Cristaudo, Vanina; Edwards, Ryan; Pospisilova, Eva; Surana, Supriya (2016)

Challenges and opportunities for Atomic Layer Deposition of 2D transition metal dichalcogenides

Delabie, Annelies; Groven, Benjamin; Heyne, Markus; Zhang, Haodong; Tomczak, Yoann; Caymax, Matty; Radu, Iuliana (2016)

Overview MX2 deposition by ALD and CVD methods

Delabie, Annelies (2016)

Upscaling the area of n-type ibc cells

Debucquoy, Maarten; Singh, Sukhvinder; O'Sullivan, Barry; Jambaldinni, Shruti; Borgers, Tom; Govaerts, Jonathan; Voroshazi, Eszter; Szlufcik, Jozef (2016)

Micro bubble jet cell sorter: advancements and validation of high throughput parallel sorting

de Wijs, Koen; Liu, Chengxun; Dusa, Alexandra; Vercruysse, Dries; Majeed, Bivragh; Mao, Shengping; Sohn, Erik; Blaszkiewicz, Kamil; Rottenberg, Xavier; Sabuncuoglu Tezcan, Deniz; Deshpande, Paru; Lagae, Liesbet (2016)

Wearable sensors: innovative technologies for healthcare

De Raedt, Walter (2016)

Image sensor technology at imec

De Moor, Piet; Lambrechts, Andy; Rottenberg, Xavier; Borremans, Jonathan (2016)

Paths towards low-damage etching of highly porous organo-silicate low-k dielectrics

de Marneffe, Jean-Francois; Zhang, Liping; Watanabe, Mitsuhiro; yatsuda, koichi; Maekawa, Kaoru; Cooke, Mike; Goodyear, Andy; Leroy, Floriane; Tillocher, Thomas; Lefaucheux, Philippe; Dussart, Remi; Dussarat, Christian; Baklanov, Mikhaïl (2016)

Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-Oxide

de Jamblinne de Meux, Albert; Pourtois, Geoffrey; Genoe, Jan; Heremans, Paul (2016)

Presentations: Recent submissions

Piezoresistivity in ultra-thin nanocrystalline diamond membranes

On the use of Cu alloys as a cation supply layer in CBRAM

1-μm-thin crystalline silicon solar cells with pseudo-ordered nanotextures

Large gas clusters for damageless molecular depth-profiling:

Challenges and opportunities for Atomic Layer Deposition of 2D transition metal dichalcogenides

Overview MX2 deposition by ALD and CVD methods

Upscaling the area of n-type ibc cells

Micro bubble jet cell sorter: advancements and validation of high throughput parallel sorting

Wearable sensors: innovative technologies for healthcare

Image sensor technology at imec

Paths towards low-damage etching of highly porous organo-silicate low-k dielectrics

Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-Oxide

Heterogeneous integration of high mobility materials on a 300mm Si platform

Atomic disorder - intrinsic source of variability in RRAM materials

Scalpel SPM toward the three-dimensional characterization of confined volumes (tutorial)

Direct three-dimensional observation of the filament in CBRAM and VCM by scalpel SPM

Passive component embedding in printed circuit boards for space applications

Potential-induced degradation (PID): A test campaign at module level

Potential-induced degradation (PID); A test campaign at module level

Directed self-assembly of silicon-containing block copolymers for 20nm lithography

Presentations: Recent submissions

Piezoresistivity in ultra-thin nanocrystalline diamond membranes ﻿

On the use of Cu alloys as a cation supply layer in CBRAM ﻿

1-μm-thin crystalline silicon solar cells with pseudo-ordered nanotextures ﻿

Large gas clusters for damageless molecular depth-profiling: ﻿

Challenges and opportunities for Atomic Layer Deposition of 2D transition metal dichalcogenides ﻿

Overview MX2 deposition by ALD and CVD methods ﻿

Upscaling the area of n-type ibc cells ﻿

Micro bubble jet cell sorter: advancements and validation of high throughput parallel sorting ﻿

Wearable sensors: innovative technologies for healthcare ﻿

Image sensor technology at imec ﻿

Paths towards low-damage etching of highly porous organo-silicate low-k dielectrics ﻿

Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-Oxide ﻿

Heterogeneous integration of high mobility materials on a 300mm Si platform ﻿

Atomic disorder - intrinsic source of variability in RRAM materials ﻿

Scalpel SPM toward the three-dimensional characterization of confined volumes (tutorial) ﻿

Direct three-dimensional observation of the filament in CBRAM and VCM by scalpel SPM ﻿

Passive component embedding in printed circuit boards for space applications ﻿

Potential-induced degradation (PID): A test campaign at module level ﻿

Potential-induced degradation (PID); A test campaign at module level ﻿

Directed self-assembly of silicon-containing block copolymers for 20nm lithography ﻿

Piezoresistivity in ultra-thin nanocrystalline diamond membranes

On the use of Cu alloys as a cation supply layer in CBRAM

1-μm-thin crystalline silicon solar cells with pseudo-ordered nanotextures

Large gas clusters for damageless molecular depth-profiling:

Challenges and opportunities for Atomic Layer Deposition of 2D transition metal dichalcogenides

Overview MX2 deposition by ALD and CVD methods

Upscaling the area of n-type ibc cells

Micro bubble jet cell sorter: advancements and validation of high throughput parallel sorting

Wearable sensors: innovative technologies for healthcare

Image sensor technology at imec

Paths towards low-damage etching of highly porous organo-silicate low-k dielectrics

Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-Oxide

Heterogeneous integration of high mobility materials on a 300mm Si platform

Atomic disorder - intrinsic source of variability in RRAM materials

Scalpel SPM toward the three-dimensional characterization of confined volumes (tutorial)

Direct three-dimensional observation of the filament in CBRAM and VCM by scalpel SPM

Passive component embedding in printed circuit boards for space applications

Potential-induced degradation (PID): A test campaign at module level

Potential-induced degradation (PID); A test campaign at module level

Directed self-assembly of silicon-containing block copolymers for 20nm lithography