Publication:

Charge trapping, mobility degradation and reliability of high-e gate stacks

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1947 since deposited on 2021-10-14
Acq. date: 2025-10-23

Citations

Metrics

Views

1947 since deposited on 2021-10-14
Acq. date: 2025-10-23

Citations