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Charge trapping, mobility degradation and reliability of high-e gate stacks
Publication:
Charge trapping, mobility degradation and reliability of high-e gate stacks
Date
2002
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cartier, Eduard
;
Kerber, Andreas
;
Pantisano, Luigi
;
Carter, Richard
;
Kauerauf, Thomas
;
Degraeve, Robin
Journal
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1947
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1947
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations