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Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques
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Authors
De Gryse, O.
;
Clauws, P.
;
Van Landuyt, J.
;
Lebedev, O.
;
Claeys, Cor
;
Simoen, Eddy
;
Vanhellemont, Jan
Issue
4
Journal
Journal of Applied Physics
Volume
91
Title
Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques
Publication type
Journal article
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