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Determination of tunnelling parameters in ultra-thin oxide poly-Si/SiO2/Si structures
Publication:
Determination of tunnelling parameters in ultra-thin oxide poly-Si/SiO2/Si structures
Date
1995
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Depas, Michel
;
Vermeire, Bert
;
Mertens, Paul
;
Van Meirhaeghe, R. L.
;
Heyns, Marc
Journal
Solid-State Electronics
Abstract
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2015
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2015
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations