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Low temperature electrical performance of ultrathin oxide MOS capacitors with p+ poly-Si1-xGex and poly-Si gate materials
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Low temperature electrical performance of ultrathin oxide MOS capacitors with p+ poly-Si1-xGex and poly-Si gate materials
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Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jacob, A. P.
;
Myrberg, T.
;
Yousif, M. Y. A.
;
Nur, O.
;
Willander, M.
;
Lundgren, P.
;
Sveinbjörnson, E. Ö.
;
Caymax, Matty
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1923
since deposited on 2021-10-14
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Acq. date: 2025-12-09
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1923
since deposited on 2021-10-14
3
last month
Acq. date: 2025-12-09
Citations