Publication:
Strong correlation between dielectric reliability and charge trapping in SiO2/Al2O3 gate stacks with TiN electrodes
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2026 since deposited on 2021-10-14
Acq. date: 2026-10-13
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Statistics
Views
2026 since deposited on 2021-10-14
Acq. date: 2026-10-13
Citations