Publication:
Electrical characterization of silicon-rich-oxide-based memory cells using pulsed current-voltage techniques
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1789 since deposited on 2021-10-14
3last month
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Acq. date: 2026-01-10
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Views
1789 since deposited on 2021-10-14
3last month
1last week
Acq. date: 2026-01-10
Citations