Publication:
Mobility reduction due to remote charge scattering in Al2O3/SiO2 gate-stacked MISFETs
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1938 since deposited on 2021-10-14
Acq. date: 2026-01-11
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Metrics
Views
1938 since deposited on 2021-10-14
Acq. date: 2026-01-11
Citations