Publication:
Mobility reduction due to remote charge scattering in Al2O3/SiO2 gate-stacked MISFETs
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1940 since deposited on 2021-10-14
2last month
Acq. date: 2026-04-06
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Statistics
Views
1940 since deposited on 2021-10-14
2last month
Acq. date: 2026-04-06
Citations