Authors

Simoen, Eddy; Claeys, Cor; Kraitchinskii, A. M.; Kras'ko, M. M.; Neimash, V. B.; Shpinar, L. I.

Conference

GADEST - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology

Title

Radiation defects and carrier lifetime in tin-doped n-type silicon

Publication type

Proceedings paper