Publication:

The mechanism of mobility degradation in misfets with Al2O3 gate dielectric

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

2000 since deposited on 2021-10-14
1last month
1last week
Acq. date: 2026-08-09

Citations

Statistics

Views

2000 since deposited on 2021-10-14
1last month
1last week
Acq. date: 2026-08-09

Citations