Publication:
Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperatures
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1935 since deposited on 2021-09-29
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Acq. date: 2026-08-04
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1935 since deposited on 2021-09-29
1last month
1last week
Acq. date: 2026-08-04
Citations