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Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping
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Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping
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2003-05
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fouchier, Marc
;
Eyben, Pierre
;
Alvarez, David
;
Duhayon, Natasja
;
Xu, Mingwei
;
Brongersma, Sywert
;
Lisoni, Judit
;
Vandervorst, Wilfried
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1995
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
1995
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-11
Citations