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Conference contributions
Chlorine detection and quantification in ALCVD HfO2 high-k dielectric films using total reflection X-ray fluorescence spectrometry
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Chlorine detection and quantification in ALCVD HfO2 high-k dielectric films using total reflection X-ray fluorescence spectrometry
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hellin, David
;
Delabie, Annelies
;
Puurunen, Riikka
;
Conard, Thierry
;
De Gendt, Stefan
;
Vinckier, Chris
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1965
since deposited on 2021-10-15
Acq. date: 2026-01-08
Citations
Metrics
Views
1965
since deposited on 2021-10-15
Acq. date: 2026-01-08
Citations