Effect of recrystallization and grain growth on the reliability of Cu-Cu wire bonds

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Authors
Ratchev, Petar; Van De Peer, Myriam; Ho, Meng; Verlinden, B.; Bender, Hugo; De Wolf, Ingrid
Conference
IMAPS-Nordic
Title
Effect of recrystallization and grain growth on the reliability of Cu-Cu wire bonds
Publication type
Proceedings paper
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