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Explaining the parameters of the electron valence-band tunneling related lorentzian noise in fully depleted SOI MOSFET's
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Authors
Simoen, Eddy
;
Mercha, Abdelkarim
;
Rafi, Joan Marc
;
Claeys, Cor
;
Lukyanchikova, N.
;
Garbar, N.
Issue
12
Journal
IEEE Electron Device Letters
Volume
24
Title
Explaining the parameters of the electron valence-band tunneling related lorentzian noise in fully depleted SOI MOSFET's
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Journal article
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