Publication:
Charge trapping and mobility degradation in MOCVD hafnium silicate gate dielectric stack structures
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1918 since deposited on 2021-10-15
4last month
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Acq. date: 2026-08-06
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Statistics
Views
1918 since deposited on 2021-10-15
4last month
2last week
Acq. date: 2026-08-06
Citations