Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Complex admittance analysis for La2Hf2O7/SiO2 high-kappa dielectric stacks
Publication:
Complex admittance analysis for La2Hf2O7/SiO2 high-kappa dielectric stacks
Copy permalink
Date
2004
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Apostolopoulos, G.
;
Vellianitis, G.
;
dimoulas, A.
;
Hooker, Jacob
;
Conard, Thierry
Journal
Applied Physics Letters
Abstract
Description
Statistics
Views
2023
since deposited on 2021-10-15
Acq. date: 2026-07-16
Citations
Statistics
Views
2023
since deposited on 2021-10-15
Acq. date: 2026-07-16
Citations