Complex admittance analysis for La2Hf2O7/SiO2 high-kappa dielectric stacks

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Authors

Apostolopoulos, G.; Vellianitis, G.; dimoulas, A.; Hooker, Jacob; Conard, Thierry

Issue

2

Journal

Applied Physics Letters

Volume

84

Title

Complex admittance analysis for La2Hf2O7/SiO2 high-kappa dielectric stacks

Publication type

Journal article

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