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Effect of postdeposition anneal conditions on defect density of HfO2 layers measured by wet etching
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Authors
Claes, Martine
;
De Gendt, Stefan
;
Witters, Thomas
;
Kaushik, Vidya
;
Conard, Thierry
;
Zhao, Chao
;
Manabe, Y.
;
Delabie, Annelies
;
Röhr, Erika
;
Chen, Jerry
;
Tsai, Wilman
;
Heyns, Marc
Issue
11
Journal
Journal of the Electrochemical Society
Volume
151
Title
Effect of postdeposition anneal conditions on defect density of HfO2 layers measured by wet etching
Publication type
Journal article
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