Publication:
Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETs
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2032 since deposited on 2021-10-15
Acq. date: 2026-01-06
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2032 since deposited on 2021-10-15
Acq. date: 2026-01-06
Citations