Authors

Jeamsaksiri, Wutthinan; Mercha, Abdelkarim; Ramos, Javier; Decoutere, Stefaan; Cubaynes, Florence

Conference

Proceedings of the International Conference on Microelectronic Test Structures - ICMTS

Title

Optimal frequency range selection for full C-V characterization above 45MHz for ultra thin (1.2-nm) nitrided oxide MOSFETs

Publication type

Proceedings paper