Publication:

Study of pulsed RF DPN process parameters for 65 nm node MOSFET gate dielectrics

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1979 since deposited on 2021-10-15
Acq. date: 2026-01-08

Citations

Metrics

Views

1979 since deposited on 2021-10-15
Acq. date: 2026-01-08

Citations