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Low-frequency noise behavior of SiO2-HfO2 dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness
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Authors
Simoen, Eddy
;
Mercha, Abdelkarim
;
Pantisano, Luigi
;
Claeys, Cor
;
Young, E.
Issue
5
Journal
IEEE Trans. Electron Devices
Volume
51
Title
Low-frequency noise behavior of SiO2-HfO2 dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness
Publication type
Journal article
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