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Sealing of porous low-k dielectrics: an ellipsometric porosimetry study of UV-O3 oxidized SiOxCy films
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Authors
Whelan, Caroline
;
Le, Quoc Toan
;
Cecchet, Francesca
;
Satta, Alessandra
;
Pireaux, Jean-Jacques
;
Rudolf, Petra
;
Maex, Karen
Issue
2
Journal
Electrochemical and Solid-State Letters
Volume
7
Title
Sealing of porous low-k dielectrics: an ellipsometric porosimetry study of UV-O3 oxidized SiOxCy films
Publication type
Journal article
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