Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
Nano-beam diffraction investigation of the strain evolution in SiGe channel pFETs with gate first or gate last process
Statistics
Statistics by Category
Download view's map
PNG
JPEG/JPG
Reports
Most viewed
Most viewed per month
Top city views
File Visits
Export Excel
Export CSV
Item
Views
Nano-beam diffraction investigation of the strain evolution in SiGe channel pFETs with gate first or gate last process
1342