Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
Validation of retention modeling as a trap-profiling technique for SiN-based charge-trapping memories
Statistics
Statistics by Category
Download view's map
PNG
JPEG/JPG
Reports
Most viewed
Most viewed per month
Top city views
File Visits
Export Excel
Export CSV
Item
Views
Validation of retention modeling as a trap-profiling technique for SiN-based charge-trapping memories
1350