Publication:
Validation of retention modeling as a trap-profiling technique for SiN-based charge-trapping memories
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1956 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-01-10
Citations
Metrics
Views
1956 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-01-10
Citations