Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
Excess Lorentzian noise in partially-depleted SOI-nMOSFETs induced by an accumulation back gate-bias
Statistics
Statistics by Category
Download view's map
PNG
JPEG/JPG
Reports
Most viewed
Most viewed per month
Top city views
File Visits
Export Excel
Export CSV
Item
Views
Excess Lorentzian noise in partially-depleted SOI-nMOSFETs induced by an accumulation back gate-bias
1353