Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
FETs on 2-D materials: deconvolution of the channel and contact characteristics by four-terminal resistance measurements on WSe2 transistors
Statistics
Statistics by Category
Download view's map
PNG
JPEG/JPG
Reports
Most viewed
Most viewed per month
Top city views
File Visits
Export Excel
Export CSV
Item
Views
FETs on 2-D materials: deconvolution of the channel and contact characteristics by four-terminal resistance measurements on WSe2 transistors
1332