Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Modeling the effect of charges in the back side passivation layer on through silicon via (TSV) capacitance after wafer thinning
  3. Statistics

Statistics by Category

Reports

  • Most viewed
  • Most viewed per month
  • Top city views
  • File Visits
Item Views
Modeling the effect of charges in the back side passivation layer on through silicon via (TSV) capacitance after wafer thinning 1360

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings