Browsing by Author "Agaiby, R."
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Publication Insight into the aggravated lifetime reliability in advanced MOSFETs with strained Si channels on SiGe strain relaxed buffers due to self-heating
Journal article2008, IEEE Transactions on Electron Devices, (55) 6, p.1568-1573Publication Quantifying self-heating effects with scaling in globally strained Si MOSFETS
Journal article2007, Solid-State Electronics, (51) 11_12, p.1473-1478Publication Reduced self-heating by strained silicon substrate engineering
Publication Reduced self-heating by strained silicon substrate engineering
Publication Strain engineering for high mobility channels
Publication Strained Si/SiGe MOS technology
Publication Strained Si/SiGe MOS technology: improving gate dielectric integrity