Browsing by Author "Alvarez, D."

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High-resolution scanning spreading resistance microscopy of surrounding-gate transistors

Alvarez, D.
;
Schömann, S.
;
Goebel, B.
;
Manger, D.
;
Schlösser, T.
;
Slesazeck, S.
;
Hartwich, J.
;
Kretz, J.
Journal article
2004-01, Journal of Vacuum Science and Technology B, (22) 1, p.377-380
Probing electrical properties of semiconductor structures on the nm-scale

Vandervorst, Wilfried
;
Meuris, Marc
;
De Wolf, P.
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Alvarez, D.
;
Hantschel, Thomas
;
Trenkler, T.
Oral presentation
2008, Seeing at the Nanoscale VI
Sub-5-nm-spatial resolution in scanning spreading resistance microscopy using full-diamond tips

Alvarez, D.
;
Hartwich, J.
;
Fouchier, Marc
;
Eyben, Pierre
;
Vandervorst, Wilfried
Journal article
2003, Applied Physics Letters, (82) 11, p.1724-1726