Browsing by Author "Andries, E."
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Publication Analytical bounds for the MLE of the Weibull shape parameter
Proceedings paper2002, Communications of the 3rd International Conference on Mathematical Methods in Reliability - MMR, 17/06/2002, p.31-34Publication Application of general finite mixture models to reliability data using likelihood estimation
Publication High-resolution SILC measurements of thin SiO2 at ultra low voltages
Journal article2002, Microelectronics Reliability, (42) 9_11, p.1485-1489Publication Poly (5,6-dithiooctylisothianaphtene), a new low band gap polymer: spectroscopy and solar cell construction
Publication Statistical aspects of the degradation of LDD nMOSFETs
Journal article2002, Microelectronics Reliability, (42) 9_11, p.1409-1413Publication The use of random effects in modeling non-linear hot-carrier degradation data
Proceedings paper2002, Communications of the 3rd International Conference on Mathematical Methods in Reliability - MMR, 17/06/2002, p.35-38