Browsing by Author "Asanovski, Ruben"
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Publication Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K
Journal article2024, SOLID-STATE ELECTRONICS, (215) May, p.Art. 108881Publication Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
Journal article2023, SOLID-STATE ELECTRONICS, (207) September, p.Art. 108722Publication Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 4, p.2135-2141Publication Understanding the Self-Heating Effects Measured With the AC Output Conductance Method in Advanced FinFET Nodes
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