imec Institutional Repository Browsing {{ collection }} by Author "Atkinson, A."

Publication

A method to interpret micro-Raman experiments made to measure nonuniform stresses: application to local oxidation of silicon structures

Pinardi, Kuntjoro

;

Jain, Suresh

;

Willander, M.

;

Atkinson, A.

;

Maes, Herman

Journal article

1998, Journal of Applied Physics, (84) 5, p.2507-2512

Publication

Convolution of spectra in optical microprobe experiments

Atkinson, A.

;

Jain, Suresh

;

Webb, S. J.

Journal article

1999, Semiconductor Science and Technology, (14) 6, p.561-564

Publication

Depth profiling of strain using micro-Raman measurements

Atkinson, A.

;

Jain, Suresh

;

Maes, Herman

;

Pinardi, Kuntjoro

;

Willander, M.

Journal article

2001, Semiconductor Science and Technology, (16) 7, p.584-588

Publication

Dislocations in GaN/sapphire films: their distribution and effect on stress and optical properties

Jain, Suresh

;

Pinardi, Kuntjoro

;

Maes, Herman

;

Van Overstraeten, Roger

;

Willander, M.

Proceedings paper

1998, Nitride Semiconductors, 1/12/1997, p.875-880

Publication

Measurement of nonuniform stresses in semiconductor films by optical methods

Pinardi, Kuntjoro

;

Jain, Suresh

;

Maes, Herman

;

Van Overstraeten, Roger

;

Willander, M.

Oral presentation

1997, Materials Research Society 1997 Fall Meeting : Symposium on Thin Film Stresses and Mechanical Properties; December 1-5, 1997; Bo

Publication

Measurement of nonuniform stresses in semiconductors by the micro-Raman method

Pinardi, Kuntjoro

;

Jain, Suresh

;

Maes, Herman

;

Van Overstraeten, Roger

;

Willander, M.

Proceedings paper

1998, Thin Films: Stresses and Mechanical Propeties VII, 1/12/1997, p.507-512

Publication

Measurement of residual stress in thin films by using the optical microprobe

Atkinson, A.

;

Clarke, D. R.

;

Jain, Suresh

;

Pinardi, Kuntjoro

;

Webb, S.

Proceedings paper

1998, Thin Films: Stresses and Mechanical Propeties VII, 1/12/1997, p.513-518

Publication

Raman spectra of Ge0.11Si0.89 strained quantum wires

Jain, Suresh

;

Pinardi, Kuntjoro

;

Maes, Herman

;

Van Overstraeten, Roger

;

Atkinson, A.

Journal article

1997, Semiconductor Science and Technology, (12) 11, p.1507-1509

Publication

Spatially resolved stress analysis using Raman spectroscopy

Atkinson, A.

;

Jain, Suresh

Journal article

1999, Journal of Raman Spectroscopy, (30) 10, p.885-891

Publication

Stability of dislocations in epitaxially strained semiconductor strained stripe stripe films

Atkinson, A.

;

Pinardi, Kuntjoro

;

Jain, Suresh

Journal article

1996, Semiconductor Science and Technology, (11) 9, p.1271-1275

Publication

Stability of epitaxially strained semiconductor stripes

Atkinson, A.

;

Jain, Suresh

;

Pinardi, Kuntjoro

Oral presentation

1996, Materials Research Society Spring Meeting. Symposium B on Defects and Interfaces in Lattice-Mismatched Semiconductor Heterostruc

Publication

Stresses in strained GeSi stripes: calculation and determination from Raman measurements

Jain, Suresh

;

Dietrich, B.

;

Richter, H.

;

Atkinson, A.

;

Harker, A. H.

Journal article

1995, Phys. Rev. B, 52, p.6247-6253

Publication

Substrate stresses in heterostructures

Pinardi, Kuntjoro

;

Jain, Suresh

;

Maes, Herman

;

Atkinson, A.

Proceedings paper

1996, Semiconductor Devices, 11/12/1996, p.30-32

Browsing by Author "Atkinson, A."