Browsing by Author "Ayala, N."
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Publication Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits
Proceedings paper2011, 8th Spanish Conference on Electron Devices - CDE, 8/02/2011Publication Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs
Publication Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents
Proceedings paper2009-02, Spanish Conference on Electron Devices - CDE, 11/02/2009, p.156-159Publication NBTI related time-dependent variability of mobility and threshold voltage in pMOSFETs and their impact on circuit performance
Journal article2011, Microelectronic Engineering, (88) 7, p.1384-1387