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Browsing by Author "Baik, Ki-Ho"

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    Attenuated phase shifting masks in combination with off-axis illumination: A way towards quarter micron DUV lithography for random logic operations

    Ronse, Kurt  
    ;
    Pforr, Rainer
    ;
    Baik, Ki-Ho
    ;
    Jonckheere, Rik  
    ;
    Van den hove, Luc  
    Journal article
    1994, Microelectronic Engineering, 23, p.133-138
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    Extending the Limits of Optical Lithography for Arbitrary Mask Layouts Using Attenuated Phase Shifting Masks with Optimized Illumination

    Ronse, Kurt  
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    Pforr, Rainer
    ;
    Baik, Ki-Ho
    ;
    Jonckheere, Rik  
    ;
    Van den hove, Luc  
    Journal article
    1994, J. Vac. Sci. Technol. B, (12) 6, p.3783-3792
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    Lithographic evaluation of a new wet silylation process using safe solvents and the commercial photoresist AZ 5214E

    Gogolides, E.
    ;
    Baik, Ki-Ho
    ;
    Yannakopolou, K.
    ;
    Van den hove, Luc  
    Journal article
    1994, Microelectron. Eng., 23, p.267-270
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    Optimization of the optical phase shift in attenuated PSM and application to quarter micron deep-UV lithography for logics

    Ronse, Kurt  
    ;
    Pforr, Rainer
    ;
    Baik, Ki-Ho
    ;
    Jonckheere, Rik  
    ;
    Van den hove, Luc  
    Proceedings paper
    1994, Optical/Laser Microlithography VII, 02/03/1994, p.86-98
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    Proximity effects in dry developed lithography for sub-0.35 µm application

    Goethals, Mieke
    ;
    Baik, Ki-Ho
    ;
    Ronse, Kurt  
    ;
    Vertommen, Johan
    ;
    Van den hove, Luc  
    Proceedings paper
    1994, Advances in Resist Technology and Processing XI, 28/02/1994, p.394-406

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