Browsing by Author "Baravelli, Emanuele"
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Publication Correlation of fin shape fluctuations to FinFET electrical variability and noise margins of 6-T SRAM cells
Proceedings paper2009, Ultimate Integration on Silicon Conference - ULIS, 18/03/2009, p.19-22Publication Impact of LER and random dopant fluctuations on FinFET matching performance
Journal article2008, IEEE Tr. Nanotechnology, (7) 3, p.291-298Publication Impact of line-edge roughness on FinFET matching performance
Journal article2007, IEEE Trans. Electron Devices, (54) 9, p.2466-2474